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Weversbaan 1-3
2352 BZ Leiderdorp
The Netherlands
P +31 71 581 3505
F +31 71 301 0802
info@panterra.nl

Scanning Electron Microscopy (SEM)
SEM and BSEM analyses are used to assess the diagenesis of reservoir rockScanning electron microscopy (SEM) is useful for studying the pore geometry and mineral morphology of reservoir rocks and is a powerful tool for supporting the petrographic study of thin sections. SEM imaging is especially relevant for examining clay minerals.
Our Scanning Electron Microscope fro analysing and mapping the elemental composition of mineralsOur in-house JEOL JSM.6400 SEM is equipped with Energy Dispersive Analysis of X-Rays (EDAX) for analysing and mapping the elemental composition of minerals. Backscatter-electron imaging is available in combination with image analysis software that allows quantitative evaluation of pore geometry in polished thin sections.
Element scans can be performed to determine elemental variation within a single mineral

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