 Scanning electron microscopy (SEM) is useful for studying the pore geometry and mineral morphology of reservoir rocks and is a powerful tool for supporting the petrographic study of thin sections. SEM imaging is especially relevant for examining clay minerals. |
 Our in-house JEOL JSM.6400 SEM is equipped with Energy Dispersive Analysis of X-Rays (EDAX) for analysing and mapping the elemental composition of minerals. Backscatter-electron imaging is available in combination with image analysis software that allows quantitative evaluation of pore geometry in polished thin sections. |
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